Materials Characterization Lab
Atomic Force Microscope
The AFM is used to take measurements of wood, fiber, and wood polymer surface properties from micron-scale down to nano-scale including long z-scan range above 25 microns to account for the microscope roughness of wood cellular structure.
The internal three-dimensional structure of materials can be non-destructively imaged at resolutions down to 2.4µm. Computerized image analysis permits the identification of void structure and phase separations.
Dynamic Mechanical Thermal Analyzer
Rheometric Scientific DMTA-IV, computer-controlled, frequencies of 0.001 Hz to 200 Hz, temperature range of 150 °C to 600 °C, displacement amplitudes from 0.5 to 128 microns. Used to determine physical material properties through tension, compression, three-point-bending, shear, and single- and dual-cantilever testing.
Mettler Toledo TGA, for determining the weight changes in relation to change in temperature. Such analysis relies on a high degree of precision in weight, temperature, and temperature change up to 1,100°C.
Inverse Gas Chromatograph
Surface Measurement Systems (SMS) IGC, is an advanced instrument for the characterization of particulates, fibers, and thin films. IGC gives information on surface chemistry, surface adsorption, and bulk properties.
Quintek X-Ray Vertical Density Profiler
The GDP X-Ray Profiler is a complete vertical density profiling system for manufactured panel products, including, but not limited to, oriented strand board, particleboard, and medium-density fiberboard. The Density Profiler scans 2″ square samples for 2″ to 2.5″ round samples.
Surface Measurement System IGC
This equipment uses a gas-phase technique for characterizing surface and bulk properties of powders, particulates, fibers, films, and semi-solids.
Herzan Atomic Force Microscope with Nano Indenter
The Duration of a powerful tool for structural determination at sub-nanometer resolution and nanomechanical characterization with pico-Newton molecular force sensitivity.