Materials Characterization Lab

Materials Characterization Lab

Researchers at the Advanced Structures and Composites Center have the ability to probe the internal structure and properties of materials.  This allows for understanding the fundamental properties of the material from the nano to macro scale. Technical capabilities include computer analysis, advanced visualization, and multiscale microscopy.

Materials Characterization Lab

Researchers at the Advanced Structures and Composites Center have the ability to probe the internal structure and properties of materials.  This allows for understanding the fundamental properties of the material from the nano to macro scale. Technical capabilities include computer analysis, advanced visualization, and multiscale microscopy.

Dr. Douglas Gardner

Dr. Douglas Gardner

Professor of Sustainable Materials & Technology

Atomic Force Microscope

The AFM is used to take measurements of wood, fiber, and wood polymer surface properties from micron-scale down to nano-scale including long z-scan range above 25 microns to account for the microscope roughness of wood cellular structure.

X-Ray Microtomography

The internal three-dimensional structure of materials can be non-destructively imaged at resolutions down to 2.4µm. Computerized image analysis permits the identification of void structure and phase separations.

Dynamic Mechanical Thermal Analyzer

Rheometric Scientific DMTA-IV, computer-controlled, frequencies of 0.001 Hz to 200 Hz, temperature range of 150 °C to 600 °C, displacement amplitudes from 0.5 to 128 microns. Used to determine physical material properties through tension, compression, three-point-bending, shear, and single- and dual-cantilever testing.

Thermogravimetric Analyzer

Mettler Toledo TGA, for determining the weight changes in relation to change in temperature. Such analysis relies on a high degree of precision in weight, temperature, and temperature change up to 1,100°C.

Inverse Gas Chromatograph

Surface Measurement Systems (SMS) IGC, is an advanced instrument for the characterization of particulates, fibers, and thin films. IGC gives information on surface chemistry, surface adsorption, and bulk properties.

Quintek X-Ray Vertical Density Profiler

The GDP X-Ray Profiler is a complete vertical density profiling system for manufactured panel products, including, but not limited to, oriented strand board, particleboard, and medium-density fiberboard. The Density Profiler scans 2″ square samples for 2″ to 2.5″ round samples.

Surface Measurement System IGC

This equipment uses a gas-phase technique for characterizing surface and bulk properties of powders, particulates, fibers, films, and semi-solids.

Herzan Atomic Force Microscope with Nano Indenter

The Duration of a powerful tool for structural determination at sub-nanometer resolution and nanomechanical characterization with pico-Newton molecular force sensitivity.